Unit yields are a misunderstood tradition.
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Unit yields are a misunderstood tradition.
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The “P” in SPC stands for process, not product.
A common problem with SPC is that the world appears too complicated for a statistical approach to work. In complex electronics products, for example, circuit boards may have thousands of holes and microchips may have millions of transistors. Plotting control charts of each and every dimension is clearly not feasible. What can be done?
To answer this question, consider a simple product: the box in Figure 1. How many things could we measure on this box? It turns out, a great many. Length, width and height are obvious choices. But we could also measure the diagonals on all six sides, interior diagonals front-to-back and back-to-front, linear combinations of these measurements and a great many more. We could conceivably come up with dozens of measurements on this simple box.
But–and this is critical–we don’t need these measurements to control the box process. The “P” in SPC stands for process, not product. When we focus on the product, we lose sight of the fact that we’re not trying to control the product. Control of the box process may be a great deal more simple than controlling the product. And if we control the process properly, the product will take care of itself.
The statistical technique known as principle components analysis can help us determine just what is important and what is not. Most statistical software packages can perform PCA. To illustrate the approach, I measured an assortment of boxes (see figure 2). The measurements I obtained are shown (in inches) in Table 1.
When these data are crunched through PCA, we find that three principle components explain 99 percent of the variation in the data set: Component No. 1 explains 76.9 percent of the variation, component No. 2 explains 14.1 percent, and component No. 3 explains 8 percent. The PCA clearly shows that these three components are associated with A, B and C respectively. Thus, the “box process” can be characterized almost entirely by controlling these three characteristics. If we do that, the other dimensions will be OK, too.
When these data are crunched through PCA, we find that three principle components explain 99 percent of the variation in the data set: Component No. 1 explains 76.9 percent of the variation, component No. 2 explains 14.1 percent, and component No. 3 explains 8 percent. The PCA clearly shows that these three components are associated with A, B and C respectively. Thus, the “box process” can be characterized almost entirely by controlling these three characteristics. If we do that, the other dimensions will be OK, too.
An example of using this approach in the real world involves CNC machining. A defense plant machined parts for use in guided missiles. The parts were extremely complex, with thousands of holes, cutouts, etc. on each. However, when the data were analyzed using PCA, it was determined that four principle components accounted for nearly all of the process variation. Further study showed which measurements were correlated with each principle component.
From this, the engineers determined that, for all the apparent complexity, the machining process was, in fact, quite simple. The four principle components corresponded with the machining center’s four axes of movement: X, Y and Z movement of the bed, and the rotation of the table on which the parts were mounted. SPC could be accomplished by selecting those features most difficult to position in each axis of movement. Often, a single feature could measure more than one axis; for example, a hole furthest from the “home” position in both the X and Y axes. The result: One or two control charts suffice for the control of a process placing thousands of features.
Note that the features selected for SPC may be of little or no importance to the product itself. In fact, some parts were designed with “process control features” that were later removed from the part entirely. This makes sense when remembering that P stands for process, not product. If you keep that in mind, the complexity you face might just evaporate before your eyes.
In the world of work, people have a natural tendency to become emotionally involved in their jobs. This is vital if they are to take pride in their accomplishments and do quality work. However, this involvement also makes it difficult for most people to see problems in their work.
SPC benefits users by directing attention toward the facts and thus promoting reason and rationality in problem solving. In this posting, I’ll put that belief to the test by using SPC to explore an issue that has generated much emotion lately: global warming. Global warming is complex, dynamic, important and imperfectly understood. Statistical methods are designed to help us analyze just such processes.
The figure of merit in this case is the Earth’s mean temperature. Figure 1 presents a run chart of the data. The numbers are coded and show the deviation in average global temperature in hundredths of degrees C from the base period mean temperature. The base period is from 1951 to 1980. A value of 0 indicates an annual global mean temperature equal to the base period mean, while a value of 20 indicates a temperature 0.20° C below the average during the base period. The chart includes data from 1866 to 1996. (There is a comment about more recent data.)

Putting the data into a run chart shows 131 years of temperature variation at a glance. Initially, temperatures are cooler, roughly 0.50° C below the base period mean. At the end they are warmer, roughly 0.25° C above the base period mean.
In SPC, the preferred approach to determine potential long-term process performance is to conduct a process capability analysis. In a PCA, changes are carefully controlled to determine how the process behaves under ideal conditions. Control limits are computed from the PCA data and used to identify important changes that occur in the future.
Needless to say, we can’t to do this with many of our processes, including the global warming process. Instead, we are forced to deal with things the way they are. A first step is to compute the control limits for these data. To do this, we first must estimate the process average and standard deviation, s. The temptation is to compute the average and s by using a spreadsheet such as Excel, which gives us an average of 10.4 and s = 24.30.
However, computing s in this way only works if the process is in a state of statistical control. When the process’s state is unknown, it’s far better to base our sigma estimate on the “moving range.” A recent article in Quality Engineering shows that s can be estimated accurately by multiplying the median moving range by 1.047. With this method, we get s = 10.47.
The control limits are set at plus-and-minus three standard deviations from the long-term mean, giving 41.8 and 21.1 using coded measurement units. Figure 2 shows the control chart with the average and control limits drawn in. There are points below the lower control limit at the beginning of the chart, followed by points above the upper control limit at the end of the chart. This is an SPC definition of a trend.
We’ve now established that between 1866 and 1996, the global mean temperature measurements increased. If we compare the first 20 years on the chart to the last 20, the change is +64.4, or an increase of 0.64° C. The next step is to identify the special cause or causes behind this change. We will explore this issue in a future posting.